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Monday 9 September 2013

7:30
Registration
8:40
Opening speech
Prof. Ph. Toint, Dr D. Strivay, Prof Guy Terwagne
9:00
Prof P. Sigmund Hans Henrik Andersen, the Scientist
9:40
Dr L. Beck
Implantation and analysis of helium at the Jannus-Saclay platform
10:00
Mr Z. Siketic
Development of TOF sims setup at the Ruder Boskovic Institute in Zagreb
10:20
Coffee break
10:50
Prof A. Zucchiatti

Ion beam analysis: new trends and challenges

11:30
Miss S. Agarwal
Nuclear reaction analysis of helium mobility in carbide and nitride advanced ceramics
11:50
Dr J. Colaux
Comparison of Ion Beam Analysis with the European reference method of acid digestion ICP-MS for the measurement of elements in ambient particulate matter
12:10
Dr J. Meerschaut
Calibration of PIXE yields using binary thin films on Si
12:30
Lunch break
2:00
Mr M. Laitinen
The different origins of the background events in the TOF-E coincidence histogram
2:20
Dr V.E. Nuttens
Determination of the light yield and attenuation length of scintillating fibres using a standard PET cyclotron
2:40
Dr C. Raepsaet
Development of a device for helium thermal diffusion investigations by IBA in self-irradiated storage glassy matrices
3:00
Dr H. Silva
Comparative study between anodized and implanted Tantalum oxide targets for the study of 16O+16O fusion reaction
3:20
Dr O. Lozano Garcia
The use of PIXE in the field of contemporary nanotechnology issues: from nanoparticles in water pumps to the biopersistence in rat organs
3:40
Coffee break
4:10 Dr M. Jacquet

X-ray production with Compton compact sources and potential of applications

4:50
Dr Chris. Jeynes
High accuracy energy calibration for electrostatic ion accelerators
5:10
Dr L. Palla
Performance upgrades at the DEFEL pulsed beam line of the Tandetron accelerator of LABEC, Florence
5:30
Prof G. Terwagne
Fast and accurate method for accelerator energy calibration
5:50 End
7:00 Welcome reception - Palais des Congrès - Namur
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